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Investigation of electrophysical and photoelectrical properties of Ge1-xSx /Ge heterostructures obtained by molecular-beam epitaxy method

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The Fifth Conference “ Nuclear Science and Its Application”, 14-17 October 2008

INVESTIGATION OF ELECTROPHYSICAL AND PHOTOELECTRICAL

PROPERTIES OF Ge1 xSix /Ge HETEROSTRUCTURES OBTAINED BY

MOLECULAR-BEAM EPITAXY METHOD

ABBASOV SH.M.. AGAVERDIYEVA G.T., *IBRAH1M0V Z A ., *FARAJOVAU.T.

Institute o f Radiation Problems, Azerbaijan National Academy o f Sciences ^National Academy o f Aviation

Phone: (+99412)4393-391; fax: (+99412)4398-318; e-mail: shabbasov(q),rambler.ru

Ge, xSix/Ge solid solutions are considered one o f perspective materials used in m odem electronics. As the band-gap energy in these solutions is less than that o f Si, but mobility o f charge carriers is more than that o f Si, these solutions are used to prepare heterostructure.

Nowadays transistors, anodes and integrated circuits distinguishing by their accuracy, mobility and restlessness have been developed on the base o f Ge, xSix solid solutions. Ge, xSix solid solutions have been obtained by Czochralski method.

During the process the crystals were alloyed by boron and phosphorus. Crystals were cut into perpendicular boards from 30 up to 42 in diameter in <110> direction.

P-type Ge, xSix boards polished like plate glass were used to develop diode structures. Here specific resistance o f p-type Ge, xSix boards was p=4.8 O hm sm , but specific resistance o f n-type Ge boards was p— 5-S-4.5 Ohm sm, nthickness o f the boards « 400 mkm.

After the heterostructure had been obtained, p+and n+layers o f boron and phosphorus 8-10 mkm in depth were obtained from p- and n- sides o f the sample and silicate glass by diffusion. The contact pieces were made o f nickel.

F igure. 1.1 —proportional current-voltage characteristic, 2 —not proportional current-voltage characteristic

a — current-voltage characteristic for proportional street, 6 — for not proportional street. 1 - before radiation, 2 -afte r radiation 30 krad, 3 -lOOkrad

Diode structures with the field « Ism 2 were cut from the obtained samples.

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The Fifth Conference “ Nuclear Science and Its Application”, 14-17 October 2008

voltage characteristic o f the samples were measured at room temperature at constant current. In order to obtain thin Ge, xSix (x= 0.10) on Ge substrate the sample from the side o f G e ,xSix was mechanochemically polished, so Ge, xSix solution with « 400 mkm density was obtained on thick Ge substrate. Elastic voltage and defects o f the crystal structure were studied by X-ray topography method using continuous synchronous radiation.

It was revealed that variety o f thermal expansion coefficients and param eters o f Ge, xSix and Ge crystal lattices leads to considerable increase o f tension. A t the result o f this tension crystal lattice is exposed to elastic and plastic deformation.

Current-voltage characteristic o f the samples obtained was m easured before and after radiation.

As it seems from Figure 1. resistance o f the samples increases after radiation and the current passing through the sample decreases.

It was determined that during radiation o f Ge,_xSix (x=0-r0.15) solid solution linearity o f current-voltage characteristic deteriorates and three fields are observed. These dependence shows that there are deep donor layers in restricted band o f Ge,_xSix solid solution.

During the experiment after radiation defects generate in restricted band and their concentration increases simultaneously with the increase o f radiation dose, n- Ge, xSix solid solution is compensated after radiation and this provides its light-sensitivity.

For additional information photoconductivity o f the samples at room temperature was measured.

F igure 2. Photoconductivity o f Ge, xSix samples before and after radiation at room temperature

1 -before radiation, 2,3 - after radiation.

As it seems from Figure 2. light-sensitivity o f the samples in heterostructures after radiation in 1.0 < hv < 1.11 eV field has increased. The sensitivity o f heterostructures increase more in comparison with that o f solid solutions. The generation o f this additional sensitivity can be manifested by deformation o f crystal lattice as hypothesis in die meantime.

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