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Novel techniques in multi-frequency atomic force microscopy and spectroscopy

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Figure 2.1: AFM apparatus principle. Cantilever movement on a substrate under controlled constant force or other parameters
Figure 2.2: AFM working principle described for dynamic mode with closed loop for keeping amplitude constant while imaging
Figure 2.3: Nanoparticle capturing of the blunt tip and sudden improvement in imaging quality 1
Figure 2.4: Nanoparticle capturing of the blunt tip and sudden improvement in imaging quality 2
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