Yüksek Lisans, Gebze Yüksek Teknoloji Enstitüsü, Fen Bilimleri Enstitüsü, Fizik, Türkiye

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Doç.Dr. EMRE COŞKUN Doç.Dr. EMRE COŞKUN Kişisel Bilgiler

Kişisel Bilgiler

İş Telefo nu:

İş Telefo nu: +90 286 218 0018 Dahili: 22220 E-po sta:

E-po sta: ecoskun@comu.edu.tr W eb:

W eb: https://avesis.comu.edu.tr/ecoskun

Eğitim Bilgileri Eğitim Bilgileri

Post Doktora, Orta Doğu Teknik Üniversitesi, Fen Edebiyat Fakültesi, Fizik, Türkiye 2012 - 2014 Doktora, Çanakkale Onsekiz Mart Üniversitesi, Fen Edebiyat Fakültesi, Fizik, Türkiye 2005 - 2012 Yüksek Lisans, Gebze Yüksek Teknoloji Enstitüsü, Fen Bilimleri Enstitüsü, Fizik, Türkiye 2003 - 2005 Lisans, Hacettepe Üniversitesi, Mühendislik Fakültesi, Fizik Mühendisliği, Türkiye 1996 - 2003

Yabancı Diller Yabancı Diller

İngilizce, B2 Orta Üstü

Yaptığı Tezler Yaptığı Tezler

Doktora, İnce filmlerin optik özelliklerinin integral dönüşüm yöntemleri ile incelenmesi, Çanakkale Onsekiz Mart Üniversitesi, Fen Edebiyat Fakültesi, Fizik, 2012

Yüksek Lisans, TlGaSe2 kristalinin ısıl uyarılmış akım yöntemi ile incelenmesi , Gebze Yüksek Teknoloji Enstitüsü, Fen Bilimleri Enstitüsü, Fizik, 2005

Araştırma Alanları Araştırma Alanları

Fizik, Yoğun Madde 1:Yapısal, Mekanik ve Termal Özellikler , Yüzeyler ve arayüzeyler; İnce filmler ve nanosistemler, Yoğun Madde 2:Elektronik Yapı, Elektrik, Manyetik ve Optik Özellikler, Elektronik yapı, arayüzeylerin, ince filmlerin ve düşük boyutlu yapıların elektrik özellikleri, Optik özellikler, Yoğun madde spektroskopisi, Temel Bilimler

Akademik Unvanlar / Görevler Akademik Unvanlar / Görevler

Araştırma Görevlisi Dr., Çanakkale Onsekiz Mart Üniversitesi, Fen Edebiyat Fakültesi, Fizik, 2005 - Devam Ediyor

SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler SCI, SSCI ve AHCI İndekslerine Giren Dergilerde Yayınlanan Makaleler

I. Impro vement o f electrical characteristics o f SnSe/Si hetero structure by integratio n o f Si nano wiresImpro vement o f electrical characteristics o f SnSe/Si hetero structure by integratio n o f Si nano wires COŞKUN E., Gullu H. H. , Emir C., PARLAK M.

PHYSICA B-CONDENSED MATTER, cilt.604, 2021 (SCI İndekslerine Giren Dergi)

II. Simultaneo us determinatio n o f the thickness and refractive index dispersio n o f dielectric films bySimultaneo us determinatio n o f the thickness and refractive index dispersio n o f dielectric films by the Paul wavelet transfo rm

the Paul wavelet transfo rm

ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

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THIN SOLID FILMS, cilt.692, 2019 (SCI İndekslerine Giren Dergi)

III. F ABRICATION AND CHARACTERIZ ATION OF TiO2 THIN F IL M F OR D EVICE APPL ICATIONSF ABRICATION AND CHARACTERIZ ATION OF TiO2 THIN F IL M F OR D EVICE APPL ICATIONS Hosseini A., Gullu H. H. , Coskun E., Parlak M., Ercelebi C.

SURFACE REVIEW AND LETTERS, cilt.26, sa.6, 2019 (SCI İndekslerine Giren Dergi)

IV. The zero o rder generalized Mo rse wavelet metho d to determine the refractive index and extinctio nThe zero o rder generalized Mo rse wavelet metho d to determine the refractive index and extinctio n co efficient dispersio ns o f an abso rbing film

co efficient dispersio ns o f an abso rbing film KOCAHAN YILMAZ Ö., COŞKUN E., Tiryaki E., ÖZDER S.

THIN SOLID FILMS, cilt.673, ss.72-77, 2019 (SCI İndekslerine Giren Dergi)

V. D eterminatio n o f phase fro m the ridge o f CW T using generalized Mo rse waveletD eterminatio n o f phase fro m the ridge o f CW T using generalized Mo rse wavelet KOCAHAN YILMAZ Ö., Tiryaki E., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.29, sa.3, 2018 (SCI İndekslerine Giren Dergi)

VI. The generalized Mo rse wavelet metho d to determine refractive index dispersio n o f dielectric filmsThe generalized Mo rse wavelet metho d to determine refractive index dispersio n o f dielectric films KOCAHAN YILMAZ Ö., ÖZCAN S., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.28, sa.4, 2017 (SCI İndekslerine Giren Dergi) VII. Investigatio ns o f thermal annealing ro le o n the o ptical pro perties o f Z n-In-Se thin filmsInvestigatio ns o f thermal annealing ro le o n the o ptical pro perties o f Z n-In-Se thin films

Gullu H. H. , COŞKUN E., Parlak M.

OPTIK, cilt.144, ss.603-612, 2017 (SCI İndekslerine Giren Dergi)

VIII. Generalized Mo rse wavelet fo r the determinatio n o f the birefringence o f a liquid crystal cellGeneralized Mo rse wavelet fo r the determinatio n o f the birefringence o f a liquid crystal cell KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.26, sa.8, 2015 (SCI İndekslerine Giren Dergi) IX. D evice behavio r o f an In/p-Ag(Ga,In)Te-2/n-Si/Ag hetero junctio n dio deD evice behavio r o f an In/p-Ag(Ga,In)Te-2/n-Si/Ag hetero junctio n dio de

COŞKUN E., Gullu H. H. , CANDAN İ., Bayrakli O., PARLAK M., Ercelebi C.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.34, ss.138-145, 2015 (SCI İndekslerine Giren Dergi) X. Study o n the Structural and Electrical Pro perties o f Sequentially D epo sited Ag-Ga-In-Te Thin F ilmsStudy o n the Structural and Electrical Pro perties o f Sequentially D epo sited Ag-Ga-In-Te Thin F ilms

COŞKUN E., Gullu H. H. , Parlak M., Ercelebi C.

JOURNAL OF LOW TEMPERATURE PHYSICS, cilt.178, ss.162-173, 2015 (SCI İndekslerine Giren Dergi)

XI. Investigatio n o f structural and o ptical parameters o f Cu-Ag-In-Se thin films depo sited by thermalInvestigatio n o f structural and o ptical parameters o f Cu-Ag-In-Se thin films depo sited by thermal evapo ratio n metho d

evapo ratio n metho d

Gullu H. H. , CANDAN İ., COŞKUN E., Parlak M.

OPTIK, cilt.126, sa.18, ss.1578-1583, 2015 (SCI İndekslerine Giren Dergi) XII. Characterizatio n o f Co -evapo rated Cu-Ag-In-Se Thin F ilmsCharacterizatio n o f Co -evapo rated Cu-Ag-In-Se Thin F ilms

Gullu H. H. , COŞKUN E., Parlak M.

BRAZILIAN JOURNAL OF PHYSICS, cilt.44, sa.6, ss.719-725, 2014 (SCI İndekslerine Giren Dergi)

XIII. D evice applicatio n o f AgGa0.5In0.5Se2 thin films depo sited by thermal sequential stacked layerD evice applicatio n o f AgGa0.5In0.5Se2 thin films depo sited by thermal sequential stacked layer metho d

metho d

COŞKUN E., Gullu H. H. , Parlak M.

MATERIALS RESEARCH EXPRESS, cilt.1, sa.4, 2014 (SCI İndekslerine Giren Dergi)

XIV. Generalized Mo rse wavelets fo r the phase evaluatio n o f pro jected fringe patternGeneralized Mo rse wavelets fo r the phase evaluatio n o f pro jected fringe pattern KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.

MEASUREMENT SCIENCE AND TECHNOLOGY, cilt.25, sa.10, 2014 (SCI İndekslerine Giren Dergi)

XV. The Paul wavelet algo rithm: an alternative appro ach to calculate the refractive index dispersio n o f aThe Paul wavelet algo rithm: an alternative appro ach to calculate the refractive index dispersio n o f a dielectric film fro m transmittance spectrum

dielectric film fro m transmittance spectrum COŞKUN E., ÖZDER S., Tiryaki E.

APPLIED PHYSICS B-LASERS AND OPTICS, cilt.113, sa.2, ss.243-250, 2013 (SCI İndekslerine Giren Dergi)

XVI. Structural and o ptical pro perties o f Z n-In-Te thin films depo sited by thermal evapo ratio n techniqueStructural and o ptical pro perties o f Z n-In-Te thin films depo sited by thermal evapo ratio n technique Gullu H. H. , Bayrakli O., CANDAN İ., COŞKUN E., Parlak M.

JOURNAL OF ALLOYS AND COMPOUNDS, cilt.566, ss.83-89, 2013 (SCI İndekslerine Giren Dergi)

XVII. Paul wavelet algo rithm fo r the determinatio n o f birefringence dispersio n o f a liquid crystal cellPaul wavelet algo rithm fo r the determinatio n o f birefringence dispersio n o f a liquid crystal cell COŞKUN E., ÖZDER S.

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, cilt.28, sa.12, ss.2974-2978, 2011 (SCI İndekslerine Giren Dergi)

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XVIII. D eterminatio n o f the refractive index o f a dielectric film co ntinuo usly by the generalized S-D eterminatio n o f the refractive index o f a dielectric film co ntinuo usly by the generalized S- transfo rm

transfo rm

COŞKUN E., SEL K., ÖZDER S.

OPTICS LETTERS, cilt.35, sa.6, ss.841-843, 2010 (SCI İndekslerine Giren Dergi)

XIX. Refractive index and extinctio n co efficient determinatio n o f an abso rbing thin film by using theRefractive index and extinctio n co efficient determinatio n o f an abso rbing thin film by using the co ntinuo us wavelet transfo rm metho d

co ntinuo us wavelet transfo rm metho d COŞKUN E., SEL K., ÖZDER S., KURT M.

APPLIED OPTICS, cilt.47, sa.27, ss.4888-4894, 2008 (SCI İndekslerine Giren Dergi)

XX. D eterminatio n o f birefringence dispersio n in nematic liquid crystals by using an S-transfo rmD eterminatio n o f birefringence dispersio n in nematic liquid crystals by using an S-transfo rm Ozder S., COŞKUN E., Koysal O., Kocahan O.

OPTICS LETTERS, cilt.32, sa.14, ss.2001-2003, 2007 (SCI İndekslerine Giren Dergi) XXI. Optical phase distributio n evaluatio n by using an S-transfo rmOptical phase distributio n evaluatio n by using an S-transfo rm

Ozder S., KOCAHAN O., COŞKUN E., Goktas H.

OPTICS LETTERS, cilt.32, sa.6, ss.591-593, 2007 (SCI İndekslerine Giren Dergi)

XXII. The effect o f thermal annealing o n impurity states in ferro electric-semico nducto r TlGaSe2 within theThe effect o f thermal annealing o n impurity states in ferro electric-semico nducto r TlGaSe2 within the inco mmensurate phase

inco mmensurate phase

Seyidov M., COŞKUN E., Sahin Y., Khamoev R., Suleymanov R.

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, cilt.21, sa.2, ss.171-174, 2006 (SCI İndekslerine Giren Dergi)

Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar Hakemli Kongre / Sempozyum Bildiri Kitaplarında Yer Alan Yayınlar

I. D eterminatio n o f surface pro file o f thin films by co ntinuo us wavelet transfo rm.D eterminatio n o f surface pro file o f thin films by co ntinuo us wavelet transfo rm.

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ÖZDER S.

6. International Conference of Material Science and Nanotechnology for Next Generation (MSNG2019), Kayseri, Türkiye, 16 - 17 Ekim 2019

II. Electrical Pro perties o f Z nSe/Si Nano wire and Z nSe/Si Hetero structuresElectrical Pro perties o f Z nSe/Si Nano wire and Z nSe/Si Hetero structures BOZDOĞAN E., COŞKUN E., ÖZDER S., GÜLLÜ H. H. , PARLAK M.

Turkish Physical Society 34th International Physics Congress (TFD-34), Muğla, Türkiye, 5 - 09 Eylül 2018 III. n-Z nSe/p-Si Nano tel Hetero eklemlerin F o to -İletkenlik D avranışlarının İncelenmesin-Z nSe/p-Si Nano tel Hetero eklemlerin F o to -İletkenlik D avranışlarının İncelenmesi

COŞKUN E., GÜLLÜ H. H. , PARLAK M.

23. Yoğun Madde Fiziği Ankara Toplantısı, Ankara, Türkiye, 22 Aralık 2017

IV. D eterminatio n o f the Interface Pro perties o f p-CZ TSe/n-Si Nano wire Hetero junctio n D io deD eterminatio n o f the Interface Pro perties o f p-CZ TSe/n-Si Nano wire Hetero junctio n D io de BAYRAKLI Ö., TERLEMEZOĞLU M., GÜLLÜ H. H. , YILDIZ D. E. , ÇOLAKOĞLU T., COŞKUN E., PARLAK M.

Materials Research Society (MRS) 2017 Fall Meeting, Boston, 26 Kasım - 01 Aralık 2017

V. Optical pro perties o f slico n nano wires fo r different length fabricated by metal assisted chemicalOptical pro perties o f slico n nano wires fo r different length fabricated by metal assisted chemical ethcing metho d

ethcing metho d

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.

Turkish Physical Society 33th International Physics Congress, 6 - 09 Eylül 2017

VI. Pro ductio n o f silico n nano wire having different size by using metal assisted chemical etchingPro ductio n o f silico n nano wire having different size by using metal assisted chemical etching metho d

metho d

BOZDOĞAN E., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.

VII. Synthesis and Structural Characterizatio n o n the (Cu,Ag)GaTe2 Thin F ilms D epo sited o n SiSynthesis and Structural Characterizatio n o n the (Cu,Ag)GaTe2 Thin F ilms D epo sited o n Si Nano wires

Nano wires

COŞKUN E., GÜLLÜ H. H. , BAYRAKLI Ö., TERLEMEZOĞLU M., PARLAK M.

European Materials Research Society-Spring Meeting 2017, 22 - 26 Mayıs 2017

VIII. An Impro ved Metho d F o r D eterminatio n Of Refractive Index Of Abso rbing F ilms: A Simulatio n StudyAn Impro ved Metho d F o r D eterminatio n Of Refractive Index Of Abso rbing F ilms: A Simulatio n Study ÖZCAN S., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

32nd International Physics Congress of Turkish-Physical-Society (TPS), Bodrum, Türkiye, 6 - 09 Eylül 2016, cilt.1815

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IX. 3D Pro file Measurements o f Objects by Using Z ero Order Generalized Mo rse W avelet3D Pro file Measurements o f Objects by Using Z ero Order Generalized Mo rse W avelet KOCAHAN YILMAZ Ö., Durmus C., Elmas M. N. , COŞKUN E., Tiryaki E., ÖZDER S.

X. Optical Phase D istributio n Evaluatio n by Using Z ero Order Generalized Mo rse W aveletOptical Phase D istributio n Evaluatio n by Using Z ero Order Generalized Mo rse W avelet KOCAHAN YILMAZ Ö., Elmas M. N. , Durmus C., COŞKUN E., Tiryaki E., ÖZDER S.

XI. A Simulatio n Study fo r D eterminatio n o f Refractive Index D ispersio n o f D ielectric F ilm fro mA Simulatio n Study fo r D eterminatio n o f Refractive Index D ispersio n o f D ielectric F ilm fro m Reflectance Spectrum by Using Paul W avelet

Reflectance Spectrum by Using Paul W avelet Tiryaki E., COŞKUN E., KOCAHAN YILMAZ Ö., ÖZDER S.

XII. Quantitative Phase Imaging o f Red Blo o d Cell by D iffractio n Phase Micro sco pyQuantitative Phase Imaging o f Red Blo o d Cell by D iffractio n Phase Micro sco py KOCAHAN YILMAZ Ö., Tiryaki E., Durmus C., Elmas M. N. , COŞKUN E., ÖZDER S.

International Workshop on Computing and Electromagnetics (CEM), Barcelona, İspanya, 21 - 24 Haziran 2017, ss.21-22

XIII. An Impro ved Metho d F o r Simultaneo us D eterminatio n Of Refractive Index And Thickness OfAn Impro ved Metho d F o r Simultaneo us D eterminatio n Of Refractive Index And Thickness Of D ielectric F ilms

D ielectric F ilms A Simulatio n StudyA Simulatio n Study

Science and Applications of Thin Films, Congress & Exhibition - SATF 2016, İzmir, Türkiye, 19 - 23 Eylül 2016 XIV. D esign and D evice Applicatio n o f Si Based Cu Ag Ga Te Thin F ilm Hetero junctio nD esign and D evice Applicatio n o f Si Based Cu Ag Ga Te Thin F ilm Hetero junctio n

GÜLLÜ H. H. , COŞKUN E., BAYRAKLI Ö., PARLAK M.

Science and Application of Thin Films, Conference and Exhibition, 19 - 23 Eylül 2016

XV. D eterminatio n o f the Refractive Index o f D ielectric F ilms fro m the Transmittance Spectrum by UsingD eterminatio n o f the Refractive Index o f D ielectric F ilms fro m the Transmittance Spectrum by Using Mo rse W avelet

Mo rse W avelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., ELMAS M. N. , ÖZDER S.

Science and Applications of Thin Films, Conference & Exhibition SATF 2016, 19 - 23 Eylül 2016

XVI. Theo retical D eterminatio n o f the Refractive Index and Extinctio n Co efficient o f an Abso rbing ThinTheo retical D eterminatio n o f the Refractive Index and Extinctio n Co efficient o f an Abso rbing Thin F ilm by Using Mo rse W avelet

F ilm by Using Mo rse W avelet

TİRYAKİ E., KOCAHAN YILMAZ Ö., COŞKUN E., DURMUŞ Ç., ÖZDER S.

Science and Applications of Thin Films, Conference & Exhibition (SATF 2016), 19 - 23 Eylül 2016 XVII. A A simulatio n study fo r determinatio n o f refractive index dispersio n o f dielectric film fro msimulatio n study fo r determinatio n o f refractive index dispersio n o f dielectric film fro m

reflectance spectrum by using

reflectance spectrum by using Paul waveletPaul wavelet

TİRYAKİ E., COŞKUN E., ÖZDER S., BOZDOĞAN E., KOCAHAN YILMAZ Ö., ELMAS M. N.

XVIII. D eterminatio n o f the refractive index dispersio n o f dielectric film fro m reflectance spectrum byD eterminatio n o f the refractive index dispersio n o f dielectric film fro m reflectance spectrum by using Mo rlet wavelet

using Mo rlet wavelet

TİRYAKİ E., COŞKUN E., ÖZDER S., KUŞ E., KOCAHAN YILMAZ Ö., DURMUŞ Ç.

XIX. 3D pro file measurements o f o bjects by using zero o rder generalized Mo rse wavelet3D pro file measurements o f o bjects by using zero o rder generalized Mo rse wavelet KOCAHAN YILMAZ Ö., DURMUŞ Ç., ELMAS M. N. , COŞKUN E., TİRYAKİ E., ÖZDER S.

XX. An impro ved metho d fo r determinatio n o f refractive index o f abso rbing fılms An impro ved metho d fo r determinatio n o f refractive index o f abso rbing fılms a simulatio n studya simulatio n study ÖZCAN S., COŞKUN E., ÖZDER S., KOCAHAN YILMAZ Ö.

XXI. Optical phase distributio n evaluatio n by using zero o rder generalized Mo rse waveletOptical phase distributio n evaluatio n by using zero o rder generalized Mo rse wavelet KOCAHAN YILMAZ Ö., ELMAS M. N. , DURMUŞ Ç., COŞKUN E., TİRYAKİ E., ÖZDER S.

Turkish Physical Society 32th International Physics Congress, 6 - 09 Eylül 2016 XXII. F abricatio n and Characterizatio n o f p CuInSe2 n Si Hetero juntio n D io desF abricatio n and Characterizatio n o f p CuInSe2 n Si Hetero juntio n D io des

GÜLLÜ H. H. , BAYRAKLI Ö., COŞKUN E., PARLAK M.

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32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016

XXIII. Effect o f Nano wire L ength o n D evice Perfo rmance o f n Z nSe p Si Nano wire Hereto junctio nsEffect o f Nano wire L ength o n D evice Perfo rmance o f n Z nSe p Si Nano wire Hereto junctio ns COŞKUN E., GÜLLÜ H. H. , ÇOLAKOĞLU T., BAYRAKLI Ö., PARLAK M.

32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016 XXIV. Characterizatio n o f CZ TSe Thin F ilms fo r So lar CellCharacterizatio n o f CZ TSe Thin F ilms fo r So lar Cell

BAYRAKLI Ö., GÜLLÜ H. H. , TERLEMEZOĞLU M., PARLAK M., COŞKUN E.

32nd European Photovoltaic Solar Energy Conference and Exhibition, 20 - 24 Haziran 2016 XXV. D evice characterizatio n o f Z n Sn Se D evice characterizatio n o f Z n Sn Se Z TSe Z TSe thin films fo r so lar cellthin films fo r so lar cell

BAYRAKLI Ö., GÜLLÜ H. H. , COŞKUN E., PARLAK M.

European Materials Research Society 2016, 2 - 06 Mayıs 2016

XXVI. Effect o f nano wire length o n device perfo rmance o f n In2Se3 p Si hetero juntio nsEffect o f nano wire length o n device perfo rmance o f n In2Se3 p Si hetero juntio ns COŞKUN E., ÇOLAKOĞLU T., GÜLLÜ H. H. , BAYRAKLI Ö., PARLAK M.

XXVII. Studies o n D evice Pro perties o f n Z nSe p Si Hetero juntio n D io deStudies o n D evice Pro perties o f n Z nSe p Si Hetero juntio n D io de GÜLLÜ H. H. , BAYRAKLI Ö., COŞKUN E., PARLAK M.

XXVIII. Optical Behavio ur o f Sequantial Thermal Evapo ratio n Z nInSe2 Thin F ilmsOptical Behavio ur o f Sequantial Thermal Evapo ratio n Z nInSe2 Thin F ilms GÜLLÜ H. H. , COŞKUN E., BAYRAKLI Ö., PARLAK M.

XXIX. D evice characterizatio n o f Cu Ag Ga Te thin films fo r pho to vo ltaic applicatio nsD evice characterizatio n o f Cu Ag Ga Te thin films fo r pho to vo ltaic applicatio ns COŞKUN E., GÜLLÜ H. H. , PARLAK M.

Materials Research Society 2016, 28 Mart - 01 Nisan 2016

XXX. An Impro ved Metho d F o r The D eterminatio n Of Birefringence D ispersio n Of L iquid Crystal Cell: AAn Impro ved Metho d F o r The D eterminatio n Of Birefringence D ispersio n Of L iquid Crystal Cell: A Simulatio n Study

Simulatio n Study

9th International Physics Conference of the Balkan-Physical-Union (BPU), İstanbul, Türkiye, 24 - 27 Ağustos 2015, cilt.1722

XXXI. Investigatio n o f Electrical Pro perties o f Cu Ag In Se Thin F ilms D epo sited by Thermally Evapo ratio nInvestigatio n o f Electrical Pro perties o f Cu Ag In Se Thin F ilms D epo sited by Thermally Evapo ratio n Metho d

Metho d

GÜLLÜ H. H. , COŞKUN E., BAYRAKLI Ö., PARLAK M., ERÇELEBİ A. Ç.

EU PVSEC 2015 31st European Photovoltaic Solar Energy Conference and Exhibition, 14 - 18 Eylül 2015 XXXII. F abricatio n and Characterizatio n o f p AgGaxIn1 xTe2 n Z nInSe2 Hetero junctio ns fo r So lar CellF abricatio n and Characterizatio n o f p AgGaxIn1 xTe2 n Z nInSe2 Hetero junctio ns fo r So lar Cell

Applicatio ns Applicatio ns

BAYRAKLI Ö., GÜLLÜ H. H. , COŞKUN E., PARLAK M.

2015 MRS Spring Meeting & Exhibit, 6 - 10 Nisan 2015

XXXIII. Material and D evice Characterizatio n o f Cu0 5Ag0 5InSe2 and Z nInSe2 Thin F ilms fo r Pho to vo ltaicMaterial and D evice Characterizatio n o f Cu0 5Ag0 5InSe2 and Z nInSe2 Thin F ilms fo r Pho to vo ltaic Applicatio ns

Applicatio ns

GÜLLÜ H. H. , COŞKUN E., BAYRAKLI Ö., PARLAK M.

2015 MRS Spring Meeting & Exhibit, 6 - 10 Nisan 2015

XXXIV. Investigatio n o f o ptical parameters o f thermally evapo rated Z nSe thin filmsInvestigatio n o f o ptical parameters o f thermally evapo rated Z nSe thin films Gullu H. H. , COŞKUN E., Parlak M.

3rd Turkish Solar Electricity Conference and Exhibition (SolarTR), Ankara, Türkiye, 27 - 29 Nisan 2015, cilt.12, ss.1224-1228

XXXV. Characterizatio n o f Sputtered Cu Z n Sn Te Thin F ilms fo r D evice Applicatio nsCharacterizatio n o f Sputtered Cu Z n Sn Te Thin F ilms fo r D evice Applicatio ns Hosseini A., GÜLLÜ H. H. , COŞKUN E., TURAN R., ERÇELEBİ A. Ç.

E-MRS 2014, 03 Haziran 2014

XXXVI. F abricatio n and Characterizatio n o f TiO2Thin F ilms fo r D evice Applicatio nsF abricatio n and Characterizatio n o f TiO2Thin F ilms fo r D evice Applicatio ns HOSSEINI A., GÜLLÜ H. H. , COŞKUN E., TURAN R., ERÇELEBİ A. Ç.

E-MRS 2014, 20 - 22 Nisan 2014

XXXVII. PL AZ MA D ESTEKL İ KİMYASAL BUHAR BİRİKTİRME SİSTEMİ İL E BÜYÜTÜL EN HİD ROJENL ENMİŞPL AZ MA D ESTEKL İ KİMYASAL BUHAR BİRİKTİRME SİSTEMİ İL E BÜYÜTÜL EN HİD ROJENL ENMİŞ AMORF SİL İSYUM KARBÜR İNCE F İL ML ERE RAD YO F REKANSI GÜCÜ ETKİSİNİN X ISINI

AMORF SİL İSYUM KARBÜR İNCE F İL ML ERE RAD YO F REKANSI GÜCÜ ETKİSİNİN X ISINI

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F OTOEL EKTRON SPEKTROMETRESİ İL E İNCEL ENMESİ F OTOEL EKTRON SPEKTROMETRESİ İL E İNCEL ENMESİ GÜLLÜ H. H. , COŞKUN E., PARLAK M.

MYOMAT 2009: I.ULUSAL METAL, YARIĐLETKEN veOKSĐT MATERYALLERĐN ÜRETĐMĐNDEKULLANILAN SĐSTEMLER ve ANALİZ TEKNİKLERİ KONGRESİ, Türkiye, 20 - 22 Nisan 2008

XXXVIII. Pro file Measurement o f Objects by Using Sto ckwell and Co ntinuo us W avelet Transfo rmsPro file Measurement o f Objects by Using Sto ckwell and Co ntinuo us W avelet Transfo rms Kocahan O., COŞKUN E., ÖZDER S.

IEEE 16th Signal Processing and Communications Applications Conference, Aydın, Türkiye, 20 - 22 Nisan 2008, ss.804-807

XXXIX. S-transfo rm analysis o f pro jected fringe patterns - art. no . 66161AS-transfo rm analysis o f pro jected fringe patterns - art. no . 66161A Kocahan O., ÖZDER S., COŞKUN E.

Conference on Optical Measurement Systems for Industrial Inspection V, Munich, Almanya, 18 - 22 Haziran 2007, cilt.6616

XL. Optical phase distributio n evaluatio n by using S-transfo rmOptical phase distributio n evaluatio n by using S-transfo rm Kocallan O., ÖZDER S., COŞKUN E.

6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.684 XLI. The determinatio n o f birefringence dispersio n in nematic liquid crystals by using the S-transfo rmThe determinatio n o f birefringence dispersio n in nematic liquid crystals by using the S-transfo rm

COŞKUN E., Oezder S., Kocahan O., Koeysal O.

6th International Conference of the Balkan-Physical-Union, İstanbul, Türkiye, 22 - 26 Ağustos 2006, cilt.899, ss.439- 440

Desteklenen Projeler Desteklenen Projeler

ÖZDER S., COŞKUN E., Yükseköğretim Kurumları Destekli Proje, İnce Filmlerin Optik Özelliklerinin İntegral Dönüşüm Yöntemleri İle Belirlenmesi, 2010 - 2012

Bilimsel Hakemlikler Bilimsel Hakemlikler

Optics Letters, SCI Kapsamındaki Dergi, Mart 2010

Atıflar Atıflar

Toplam Atıf Sayısı (WOS):134 h-indeksi (WOS):6